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HORIBA AFM光学平台可与共聚焦拉曼显微镜完全集成，支持针尖增强光学光谱（如TERS和TEPL）及共定位AFM-Raman测量，旗舰产品SignatureSPM结合AFM与拉曼实现真正的物理化学同步分析。
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements. The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
Featured product: Magnetic Force Microscopy Module - external magnet for MFM measurements with high-NA optical access, allowing automated measurements with magnetic field variation.
HORIBA's leading Raman technology is now integrated with Atomic Force Microscopy (AFM) for fast simultaneous co-localized AFM-Raman measurements, Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL). Tip-Enhanced Optical Spectroscopies (TEOS) such as TERS and TEPL provide a unique capability for the characterization of molecules, 1D and 2D materials, semiconducting nanostructures and bio-materials.
医药制造业
