SmartSPM

SmartSPM - Advanced stand-alone AFM. The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques). Features include: Automation of operation / Ease of use - Fully automated laser to photodiode alignment, easy probe exchange, fully automated configuration for the most common AFM modes, extremely fast system adjustment. Resolution / Stability / Accuracy - Single 100µm scanner for large scans down to molecular or atomic resolution, no vibration isolation required, lowest noise closed loop sensors. Fast scanning - Scanner resonant frequencies >7kHz in XY and >15kHz in Z. All SPM modes included plus Nanolithography with no additional units and costs (Kelvin Probe Microscopy, Piezoresponse Force Microscopy, Nanolithography and Nanomanipulation included). Flexibility to upgrade to AFM-Raman. Measuring Modes include: Contact AFM in air/liquid, Semicontact AFM in air/liquid, True Non-contact AFM, Dynamic Force Microscopy, Dissipation Force Microscopy, Top Mode, Phase Imaging, Lateral Force Microscopy, Force Modulation, Conductive AFM (optional), I-Top mode (optional), Magnetic Force Microscopy, Kelvin Probe, Single-pass Kelvin Probe, Capacitance Microscopy, Electric Force Microscopy, Single-pass MFM/EFM, Force curve measurements, Piezo Response Force Microscopy, PFM-Top mode, Nanolithography, Nanomanipulation, STM (optional), Photocurrent Mapping (optional), Volt-ampere characteristic measurements (optional), Shear-force Microscopy with tuning fork, Normal Force Microscopy with tuning fork. SmartSPM Scanner and Base specifications: Sample scanning range 100 µm x 100 µm x 15 µm (±10%), Scanning type by sample XY non-linearity 0.05%, Z non-linearity 0.05%, Noise <
0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on, <
0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off, <
0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth. Segment: Scientific. Division: AFM and AFM-Raman. Manufacturing Company: HORIBA France SAS.