LabRAM Nano

LabRAM Odyssey Nano - AFM-Raman for physical and chemical imaging. Fully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM Odyssey fully automated Raman micro-spectrometer. LabRAM Odyssey Nano offers full automation and versatile compatibility with outstanding performance. The LabRAM Odyssey Nano brings ease-of-use and extreme flexibility together for the most demanding applications. With capabilities from deep UV to infrared, high spectral resolution, and an extended set of options and accessories, the LabRAM Odyssey Nano is ideally suited to perform in any of your research challenge. Features include: Multi-sample analysis platform - Macro, micro and nano scale measurements can be performed on the same platform. Ease-of-use - Fully automated operation, start measuring within minutes. True confocality - High spatial resolution, automated mapping stages, full microscope visualization options. High collection efficiency - Top-down and oblique Raman detection for optimum resolution and throughput in both co-localized and Tip-Enhanced measurements (Raman and Photoluminescence). High spectral resolution - Ultimate spectral resolution performance, multiple gratings with automated switching, wide spectral range analysis. High spatial resolution - Nanoscale spectroscopic resolution (down to 10 nm) through Tip Enhanced Optical Spectroscopies. Multi-technique / Multi-environment - Numerous SPM modes including AFM, conductive and electrical modes (cAFM, KPFM), STM, liquid cell and electrochemical environment, together with chemical mapping through TERS/TEPL. Robustness / Stability - High resonance frequency AFM scanners, high performance obtained without active vibration isolation. SmartSPM Scanner and Base specifications: Sample scanning range 100 µm x 100 µm x 15 µm (±10%), XY non-linearity 0.05%, Z non-linearity 0.05%, Noise 0.1 nm RMS in XY in 200 Hz bandwidth with capacitance sensors on, 0.02 nm RMS in XY in 100 Hz bandwidth with capacitance sensors off, <
0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth, Resonance frequency XY 7 kHz, Z 15 kHz, X/Y/Z digital closed loop control, Motorized Z approach range 18 mm, Maximum sample size 40 x 50 mm, 15 mm thickness, Motorized sample positioning range 5 x 5 mm, Positioning resolution 1 µm. AFM Head: Laser wavelength 1300 nm, Registration system noise <
0.1 nm, Fully automated cantilever and photodiode alignment, Free access to the probe for additional external manipulators. SPM Measuring Modes include: Contact AFM in air/(liquid optional), Semicontact AFM in air/(liquid optional). Segment: Scientific. Division: AFM and AFM-Raman. Manufacturing Company: HORIBA France SAS.