SignatureSPM

SignatureSPM - Scanning Probe Microscope with Chemical Signature. Enhance AFM with Chemical Identification. SignatureSPM is the first microscope built on a multimodal characterization platform, integrating an automated Atomic Force Microscope (AFM) with a Raman/Photoluminescence spectrometer, enabling true colocalized measurements of physical and chemical properties. Features include all AFM modes included as standard (Kelvin Probe Microscopy, Piezo Response Force Microscopy, Magnetic Force Microscopy, Nanolithography, Force-curve Measurements), wide range spectrometer optimized for Raman and photoluminescence, true co-localized measurements with "Probe away", direct pathway to cantilever apex with high optical access, AFM for large scans and molecular resolution (100 x 100 x 15 micron-range scanner), quick and repeatable cantilever's adjustment, automated AFM registration system adjustment, and no interference between AFM laser and spectroscopic measurements. Segment: Scientific. Division: AFM and AFM-Raman. Manufacturing Company: HORIBA France SAS.